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Article Dans Une Revue Journal of Chemical Physics Année : 2015

Structural singularities in GexTe100−x films

Résumé

Structural and calorimetric investigation of GexTe100−x films over wide range of concentration 10 < x < 50 led to evidence two structural singularities at x ∼ 22 at. % and x ∼ 33-35 at. %. Analysis of bond distribution, bond variability, and glass thermal stability led to conclude to the origin of the first singularity being the flexible/rigid transition proposed in the framework of rigidity model and the origin of the second one being the disappearance of the undercooled region resulting in amorphous materials with statistical distributions of bonds. While the first singularity signs the onset of the Ge–Ge homopolar bonds, the second is related to compositions where enhanced Ge–Ge correlations at intermediate lengthscales (7.7 Å) are observed. These two threshold compositions correspond to recently reported resistance drift threshold compositions, an important support for models pointing the breaking of homopolar Ge–Ge bonds as the main phenomenon behind the ageing of phase change materials.
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Dates et versions

hal-01185202 , version 1 (15-10-2020)

Identifiants

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Andrea Piarristeguy, Matthieu Micoulaut, Raphaël Escalier, Pal Jóvári, Ivan Kaban, et al.. Structural singularities in GexTe100−x films. Journal of Chemical Physics, 2015, 143, pp.074502. ⟨10.1063/1.4928504⟩. ⟨hal-01185202⟩
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